Study on Measurement and Analysis of SPECT System Spatial Resolution, System Plane
Sensitivity and Intrinsic Maximum Count Rate

SHI Xiaorui; HE Zicong; HUI Jinzi; ZHANG Qingju; YANG Shengli; XU Jianlin; SHI Changbei

doi:10.3969/j.issn.1674-1633.2023.04.013

Study on Measurement and Analysis of SPECT System Spatial Resolution, System Plane Sensitivity and Intrinsic Maximum Count Rate

SHI Xiaorui¹, HE Zicong², HUI Jinzi³, ZHANG Qingju³, YANG Shengli³, XU Jianlin³, SHI Changbei³

China Medical Devices ›› 2023, Vol. 38 ›› Issue (4) : 74-77.

PDF(1378 KB)

China Medical Devices ›› 2023, Vol. 38 ›› Issue (4) : 74-77. DOI: 10.3969/j.issn.1674-1633.2023.04.013

RESEARCH WORK

Study on Measurement and Analysis of SPECT System Spatial Resolution, System Plane Sensitivity and Intrinsic Maximum Count Rate

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

Abstract

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 38(4): 74-77 https://doi.org/10.3969/j.issn.1674-1633.2023.04.013

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

References

Funding

RIGHTS & PERMISSIONS

PDF(1378 KB)

Accesses

Citation

Detail

Sections

Recommended

Received	Published
2022-09-23	2023-04-10
Issue Date
2023-04-18

Please choose a citation manager

Content to export