Fault Analysis and Elimination of Annular Artifacts for GE Lightspeed 16-Slice CT

ZHANG De-chuan; ZHANG Zhi-fu

doi:10.3969/j.issn.1674-1633.2015.09.056

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China Medical Devices ›› 2015, Vol. 30 ›› Issue (9) : 168-169. DOI: 10.3969/j.issn.1674-1633.2015.09.056

OPERATION & GUARANTEE FOR INSTRUMENTS

Fault Analysis and Elimination of Annular Artifacts for GE Lightspeed 16-Slice CT

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2015, 30(9): 168-169 https://doi.org/10.3969/j.issn.1674-1633.2015.09.056

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