Troubleshooting of Ring Artifacts of GE Hispeed Dual CT

DAI Yu; FAN Shi-fu; ZHANG Xiong-lin

doi:10.3969/j.issn.1674-1633.2013.10.045

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China Medical Devices ›› 2013, Vol. 28 ›› Issue (10) : 126-128. DOI: 10.3969/j.issn.1674-1633.2013.10.045

OPERATION & GUARANTEE FOR INSTRUMENTS

Troubleshooting of Ring Artifacts of GE Hispeed Dual CT

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2013, 28(10): 126-128 https://doi.org/10.3969/j.issn.1674-1633.2013.10.045

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Received	Revised	Published
2012-12-26	2014-11-25	2013-10-25
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2014-11-25

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