基于德尔菲专家咨询法的数字化X线摄影核心技术成熟度评估

毕帆,曹厚德,陈颖,钱建国,曹少平,李斌

中国医疗设备 ›› 2015, Vol. 30 ›› Issue (10) : 46-48.

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中国医疗设备 ›› 2015, Vol. 30 ›› Issue (10) : 46-48. DOI: 10.3969/j.issn.1674-1633.2015.10.012
研究论著

基于德尔菲专家咨询法的数字化X线摄影核心技术成熟度评估

  • 毕帆1,曹厚德2,陈颖1,钱建国3,曹少平4,李斌1
作者信息 +

Maturity Assessment of the Key Digital Radiography Technology Based on Delphi

  • BI Fan1, CAO Hou-de2, CHEN Ying1, Qian Jian-guo3, CAO Shao-ping4, LI Bin1
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摘要

目的 评估当前数字化X线摄影核心技术的成熟度,为医院设备采购、企业研发提供依据。方法 通过德尔菲专家咨询法、文献调查法和专家现场打分法对数字化X线摄影核心技术的成熟度进行研究。结果 经过2轮邮件调查和现场调查,得出22项数字化X线摄影核心技术并通过专家打分描绘在技术发展S曲线上,完成了核心技术的成熟度评估工作。结论 利用德尔菲专家咨询等方法确定的技术成熟度曲线提供了技术发展的趋势,为医院设备采购、企业研发等提供依据。

Abstract

Objective To assess the maturity of key digital radiography technology and provide the basis for the procurement and R&D of medical equipment. Methods According to Delphi method, literature survey and experts scoring method, research on the maturity of the key digital radiography technology was conducted. Results After two rounds of mail survey and site investigation, 22 key technologies was drawn on the S-Curve by experts scoring. And the maturity assessment of key technology was done. Conclusion Determined by Delphi method, the technology maturity could provide the technology development trend and a basis for all decision makers.

关键词

德尔菲专家咨询法 / 数字化X线摄影 / 成熟度评估 / S-曲线

Key words

delphi expert consultation method / digital radiograph / maturity assessment / S-curve

引用本文

导出引用
毕帆, 曹厚德, 陈颖, . 基于德尔菲专家咨询法的数字化X线摄影核心技术成熟度评估[J]. 中国医疗设备, 2015, 30(10): 46-48 https://doi.org/10.3969/j.issn.1674-1633.2015.10.012
BI Fan, CAO Hou-de, CHEN Ying, et al. Maturity Assessment of the Key Digital Radiography Technology Based on Delphi[J]. China Medical Devices, 2015, 30(10): 46-48 https://doi.org/10.3969/j.issn.1674-1633.2015.10.012
中图分类号: R197.39   

参考文献

[1] Sauser B,Ramirez-Marquez JE,Magnaye R.A systems approach to expanding the technology readiness level within defense acquisition[J].IJDAM,2008,1(1):39-58.
[2] Steinert M,Leifer L.Scrutinizing Gartner's hype cycle approach[C].Technology Management for Global Economic Growth (PICMET),2010 Proceedings of PICMET’10:IEEE,2010:1-13.

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